제품소개

해외 우수한 분석, 측정, 계측기기 제조회사의 독점 대리점 !

박막두께측정기

SE SeriesSE300BM

제품이미지

SPECTROSCOPIC ELLIPSOMETER

SE300BM

  • 최대 12 layers 막 두께 및 반사스펙트럼 측정
  • 시스템 자동 교정 및 초기화
  • 400 - 1100nm의 파장영역
  • 샘플크기는 150 x 150 mm, 200ø 까지 측정가능
  • 높이와 경사 조절
BEST Good
제품구성
제품구성
SE300BM
Detector Detector Array
Light Source Adjustable intensity Vis-NIR Light Source
Incident Angle Change Manual
Stage

Black Anodized Alumnium Sample holder for up to 200 mm or 150 x 150 mm samples

Software

TFProbe 3.3.x

Computer & Monitor Intel Duo Core 2.0 GHz, 19" Wide Screen LCD
Power 110 - 240 VAC /50-60Hz, 6 A
제품사양
제품사양
SE300BM
Wavelength range 400 to 1100 nm
Wavelength resolution ~ 1 nm
Spot Size 1 to 5 mm variable
Incident Angle Range

0 to 90 degree

Incident Angle Change Resolution 5 degree interval
Sample Size Up to 200 mm in diameter or 150 mm square
Substrate Size

Up to 20 mm thick

Measurable thickness range 5 nm to 30 μm
Measurement Time ~ 1s/Site
Accuracy

Better than 0.25%

Repeatability

< 1 Å (1 sigma from 50 thickness readings for

1500 Å Thermal SiO2 on Si Wafer)

옵션
옵션
SE300BM
  • Photometry measurement for Reflection and/Or Transmission Measurement
  • Micro spot for measuring small area
Automatic Goniometer for Incident angle changes
Mapping Stage (X-Y mode or Rho-Theta mode)
Heating /Cooling Stage
Vertical Sample Mounting Goniometer
  • Wavelength extension to further DUV or IR range
  • Scanning Monochromator Setup
Combined with Microspectrophotometer (MSP) for patterned sample measurement with digital imaging functions
적용분야
적용분야
SE300BM
  • Semiconductor fabrication (PR, Oxide, Nitride..)
  • Liquid crystal display (ITO, PR, Cell gap.....)
Forensics, Biological films and materials

Inks, Mineralogy, Pigments, Toners

Optical coatings, TiO2, SiO2, Ta2O5.....
Semiconductor compounds
Functional films in MEMS/MOEMS
Amorphous, nano and crystalline Si
Various TCO films (ITO, FTO, IZO, AZO...)