제품소개
해외 우수한 분석, 측정, 계측기기 제조회사의 독점 대리점 !
박막두께측정기
SE SeriesSE500BA
BEST Good
제품구성
| SE500BA | |
|---|---|
| Detector | Detector Arrays (CCD + InGaAs) |
| Light Source | High Power DUV-Vis-NIR Combined Light Source |
| Incident Angle Change | Automatic |
| Stage | Automatic Mapping with X-Y configuration |
| Software | |
| Computer & Monitor | Intel Duo Core 2.0 GHz, 19" Wide Screen LCD |
| Power | 110 - 240 VAC /50-60Hz, 6 A |
제품사양
| SE500BA | |
|---|---|
| Wavelength range | 250 to 1700 nm |
| Wavelength resolution | ~ 1 nm for DUV, ~ 3 nm for Visible and ~ 6 nm in NIR |
| Spot Size | 1 to 5 mm variable |
| Incident Angle Range | 20 to 90 degree |
| Incident Angle Change Resolution | Automatic, 0.01 degree |
| Sample Size | Up to 100 x 100 mm in diameter |
| Substrate Size | Up to 10 mm thick |
| Measurable thickness range | 0 nm to 30 μm |
| Measurement Time | ~ 1s/Site |
| Accuracy | Better than 0.25% |
| Repeatability | < 1 Å (1 sigma from 50 thickness readings for 1500 Å Thermal SiO2 on Si Wafer) |
옵션
| SE500BA |
|---|
| Photometry measurement for Reflection and/Or Transmission Measurement |
|
| Automatic Goniometer for Incident angle changes |
Other mode or size Mapping Stage |
Heating /Cooling Stage |
| Wavelength extension to further DUV or IR range |
| Scanning Monochromator Setup |
| Combined with MSP for patterned sample measurement with digital imaging functions |
적용분야
| SE500BA |
|---|
|
|
| Forensics, Biological films and materials |
Inks, Mineralogy, Pigments, Toners |
| Optical coatings, TiO2, SiO2, Ta2O5..... |
| Semiconductor compounds |
| Functional films in MEMS/MOEMS |
| Amorphous, nano and crystalline Si |
| Various TCO films (ITO, FTO, IZO, AZO...) |